Inside the lab

Facilities

The instruments we grow, pattern, and measure with — in our own lab and via central institute facilities.

In-house

Group facilities

Institute-wide

Central facilities

Accessed via the department and institute-level characterisation centres.

  • Thin Film X-ray Diffractometer
  • Atomic Force Microscope (AFM)
  • Transmission Electron Microscope (TEM)
  • Scanning Electron Microscope (SEM)
  • Physical Property Measurement System (PPMS)
  • Cryogenic Magneto-Optic Kerr Microscopy
  • High-vacuum Magnetic Force Microscopy with field control
  • E-beam lithography

For more details, visit the Department of MSME or SATHI Foundation — CISCoM.