Embedded Files
Magnetron Sputtering System
2 chamber+ Load lock
RF and DC Capability
Magneto-Optic Kerr Microscopy
In-plane and Out-of-plane Mode
Maskless Photo-lithography
Magnetic Probe Station
Hall measurements
Magneto-resistance measurements
Workstations for Micromagnetic Simulations
Ferromagnetic Resonance setup & Inverse Spin Hall measurement system (With Dr. Arabinda Haldar at Dept of Physics)
Central Facilities
Grazing Incidence X-ray Diffractometer (GI-XRD)
Atomic Force Microscope (AFM)
Transmission Electron Microscope (TEM)
Scanning Electron Microscope (SEM)
Focused Ion-Beam Milling
Physical Property Measurement System (PPMS)
Cryogenic Magneto-Optic Kerr Microscopy
High Vacuum Magnetic Force Microscopy with Field control
E-beam Lithography
For more details, visit the respective department websites:
Department of MSME, IIT Hyderabad
SATHI Foundation: Centre for In-Situ and Correlative Microscopy (CISCoM), IIT Hyderabad
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